LT-STM/AFM-System
Since 2003, the low temperature scanning tunneling microscope (LT-STM) became an essential part of the CreaTec Fischer product range. Since then the instrument is continuously developed. Today, the system offers ultimate STM, STS, and IETS performance including one of the highest LHe hold times compared to similar low-temperature machines, extremely low drift rates and outstanding stability. Apart from its nanoanalytical capabilities this allows for sophisticated spectroscopy and atom manipulation experiments as well as the study of metals, semiconductors, superconductors, and carbon at low temperature. Nevertheless, the LT-STM/AFM is also well adapted for experiments at variable temperature in the temperature range from 5 to 300 K (optional down to 3 K).
Our fully compatible low temperature atomic force microscope (AFM) was introduced in 2007 allowing for simultaneous measurements of force and tunneling current.
Since then all our scanning heads are available as single STM or combined STM/AFM machines.
Key specifications of the CreaTec LT-STM
- Ultra stable at low temperatures (highest stability, lowest drift)
- Low LN2 and LHe consumption
- Combined preparation and analysis
- Cold sample transfer
- Molecular manipulation
- Easy-to-handle software and hardware
- Simultaneous STM and AFM measurements
- Available with Besocke or Slider type scanning heads