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Createc is your innovative partner in Molecular Beam Epitaxy MBE and LT-STM-AFM.
Molecular Beam Epitaxy (MBE) | Low Temperature Scanning Tunneling Microscopy (LT-STM) | Atomic Force Microscopy (AFM) | Ultra-high Vacuum (UHV) | Effusion Cells

Createc is your innovative partner in Molecular Beam Epitaxy MBE and LT-STM-AFM.
Click to enlarge.
Beam-Flux Monitor with BA gauge mounted on a movable rod for transfer the gauge into the molecular beam.

 

 

Click to enlarge.
Example for a BAF with high stable ion gauge and linear motion (stroke 400 mm), delivered to Arizona State University, Tempe, USA.

Beam Flux Monitor


CreaTec's beam flux monitor BAF is used for the precise measurement of the beam equivalent pressure (BEP) in an MBE system. A Bayard Alpert type flux gauge on a movable positioning system allows the measurement in substrate position. High precision electronics guarantees an extremely stable detection of the investigated molecular beam intensity. With an optionally available computer system the control of the beam flux measurement is very convenient.

Technical Data:


TypeBAF
Measurement systemBayard Alpert ion gauge
Linear motion200mm to 600mm stroke, manually operated
Bakeout Temperature250?C
ElectronicsHigh precision electronics to measure the BEP current in μA with computer interface

Standards:


Flange sizeCF 40 / CF 63 or as specified
Max outer diameter34mm/ 50mm or as specified
LengthAs specified
StrokeAs specified

Options:


  • Integral shutter
  • Quartz crystal monitor instead of Bayard-Alpert ionisation gauge
  • Valve with by-pass
  • Motorized version
For further information, please contact us.

For further information, please contact
sales(at)createc.de.


Molecular Beam Epitaxy (MBE) | Low Temperature Scanning Tunneling Microscopy (LT-STM) | Atomic Force Microscopy (AFM) | Ultra-high Vacuum (UHV) | Effusion Cells