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Createc is your innovative partner in Molecular Beam Epitaxy and LT-STM-AFM.

Createc is your innovative partner in Molecular Beam Epitaxy and LT-STM-AFM.
Beam-Flux Monitor with BA gauge mounted on a movable rod for transfer the gauge into the molecular beam.
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Example for a BAF with high stable ion gauge and linear motion (stroke 400 mm), delivered to Arizona State University, Tempe, USA.
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Beam Flux Monitor

CreaTec's beam flux monitor BAF is used for the precise measurement of the beam equivalent pressure (BEP) in an MBE system. A Bayard Alpert type flux gauge on a movable positioning system allows the measurement in substrate position. High precision electronics guarantees an extremely stable detection of the investigated molecular beam intensity. With an optionally available computer system the control of the beam flux measurement is very convenient.

Technical Data:

Type

BAF

Measurement system

Bayard Alpert ion gauge

Linear motion

200mm to 600mm stroke, manually operated

Bakeout Temperature

250°C

Electronics

High precision electronics to measure the BEP current in μA with computer interface


Standards:

Flange size

CF 40 / CF 63 or as specified

Max outer diameter

34mm/ 50mm or as specified

Length

As specified

Stroke

As specified


Options:

  • Integral shutter
  • Quartz crystal monitor instead of Bayard-Alpert ionisation gauge
  • Valve with by-pass
  • Motorized version

For further information, please contact us.

For further information, please contact
sales(at)createc.de.